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PRODUCT CENTER

PRODUCT CENTER

Burst Generator

Single phase 5kV burst generator EFT S4

Model：EFT S4

In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to aꩵ certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.

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Single phase 6kV burst generator EFT S6

Model：EFT S6

In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characte🌠rized by high amplitude, short rise time, high repeti🍨tion rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.

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Three phase 5kV pulse group generator EFT T4

Model：EFT T4

In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 andಞ gb/t17626.4.

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Three phase 6kV pulse group generator EFT T6

Model：EFT T6

In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of el𓂃ectrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standa💞rds such as iec61000-4-4, en60100-4-4 and gb/t17626.4.

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Capacitive coupling clamp

Model：EFT 4C

The capacitive coupling clamp can couple the fast transient pulse group to the tested line without any electrical connection with the terminal of the tested equipment port, cable shield or any other part of the tested equipment. The capacitive coupling clamp is used in conjunction with the electric fast transient pulse group generator to superimpose interference on the input, output, control line and data line of the equipment to conduct the system anti-interference test. Comply with the standard requirements of iec61000-4-4 a⛎nd gb/t17626.4.

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